• Rodriguez, E. [et al.]. A survey of deep learning techniques for cybersecurity in mobile networks. IEEE communications surveys and tutorials, 7 Juny 2021, vol. 23, núm. 3, p. 1920-1955. https://futur.upc.edu/32051926

• Rodríguez, J. [et al.]. The diverse meteorology of Jezero crater over the first 250 sols of Perseverance on Mars. Nature Geoscience, 9 Gener 2023, vol. 16, p. 19-28. https://futur.upc.edu/35067802

• Abadal, S. [et al.]. Computing graph neural networks: A survey from algorithms to accelerators. ACM computing surveys, 1 Desembre 2022, vol. 54, núm. 9, p. 191:1-191:38. https://futur.upc.edu/32540435

• Prades, I. [et al.]. Does Sb2Se3 admit nonstoichiometric conditions? How modifying the overall se content affects the structural, optical, and optoelectronic properties of Sb2Se3 thin films. ACS applied materials and interfaces, 9 Març 2022, vol. 14, núm. 9, p. 11222-11234. https://futur.upc.edu/32870102

• Lopez-Garcia, A. [et al.]. Ultrathin a-Si:H/Oxide transparent solar cells exhibing UV-Blue selective-like absorption. Solar RRL, 15 Febrer 2023. https://futur.upc.edu/35232310

• Masmitjà, G. [et al.]. Interdigitated back-contacted crystalline silicon solar cells fully manufactured with atomic layer deposited selective contacts. Solar energy materials and solar cells, 2 Abril 2022, vol. 240, p. 111731: 1-111731: 9. https://futur.upc.edu/33063897

• Ros, E. [et al.]. Expanding the perspective of polymeric selective contacts in photovoltaic devices using branched polyethylenimine. ACS applied energy materials, 5 Setembre 2022, vol. 5, núm. 9, p. 10702-10709. https:// futur.upc.edu/34218589

• Busquets-Monge, S. [et al.]. Fast Reliability Assessment of Neutral-PointClamped Topologies through Markov Models. IEEE transactions on power electronics, 1 Desembre 2021, vol. 36, núm. 9448381, p. 13449-13459. https://futur.upc.edu/32041569

• López-Bueno, D.; Montoro, G.; Gilabert, P.L. Training data selection and dimensionality reduction for polynomial and artificial neural network MIMO adaptive digital predistortion. IEEE transactions on microwave theory and techniques, Novembre 2022, vol. 70, núm. 11, p. 4940-4954. https://futur.upc.edu/34288761

• Guillena, E. [et al.]. Reconfigurable DPD based on ANNs for wideband load modulated balanced amplifiers under dynamic operation from 1.8 to 2.4 GHz. IEEE transactions on microwave theory and techniques, 1 Gener 2021, vol. 70, núm. 1, p. 453-465. https://futur.upc.edu/32059756

• Taranco, R.; Arnau, J.; Gonzalez, A. LOCATOR: Low-power ORB accelerator for autonomous cars. Journal of parallel and distributed computing, Abril 2023, vol. 174, p. 32-45. https://futur.upc.edu/34960471

• Corbalán, D. [et al.]. Omega-Test: A predictive early-Z culling to improve the graphics pipeline energy-efficiency. IEEE transactions on visualization and computer graphics, 1 Desembre 2022, vol. 28, núm. 12, p. 4375-4388. https://futur.upc.edu/32061749

• Anglada, M. [et al.]. Fast and accurate SER estimation for large combinational blocks in early stages of the design. IEEE transactions on sustainable computing, 1 Juliol 2021, vol. 6, núm. 3, p. 427-440. https://futur.upc.edu/32533041

• Martin, I. [et al.]. Hole selective contacts based on transition metal oxides for c-Ge thermophotovoltaic devices. Solar energy materials and solar cells, 1 Març 2023, vol. 251, article 112156. https://futur.upc.edu/35037451

• Ros, E. [et al.]. Expanding the perspective of polymeric selective contacts in photovoltaic devices using branched polyethylenimine. ACS applied energy materials, 5 Setembre 2022, vol. 5, núm. 9, p. 10702-10709. https://futur.upc.edu/34218589

• Caro, M. [et al.]. An automotive case study on the limits of approximation for object detection. Journal of systems architecture, Maig 2023, vol. 138, arcle 102872, p. 1-14. https://futur.upc.edu/35704041

• Guirado, R. [et al.]. WHYPE: A scale-out architecture with wireless over-the-air majority for scalable in-memory hyperdimensional computing. IEEE Journal on Emerging and Selected Topics in Circuits and Systems, 1 Gener 2023, vol. 13, núm. 1, p. 137-149. https://futur.upc.edu/35571699

• Filba, À. [et al.]. An intelligent electronic fuse for selective isolation of faulty switching cells in power electronic converter legs to guarantee continuous operation. IEEE journal of emerging and selected topics in power electronics, 15 Juny 2022, vol. 10, núm. 6, p. 7665-7676. https://futur.upc.edu/34269106

• Fernández, D. [et al.]. Monolithic sensor integration in CMOS technologies. IEEE sensors journal, 9 Desembre 2022, vol. 23, núm. 2, p. 1479-1496. https://futur.upc.edu/35066831

• Ruano, G. [et al.]. Free-standing, flexible nanofeatured polymeric films prepared by spin-coating and anodic polymerization as electrodes for supercapacitors. Molecules (Basel, Switzerland), 2 Juliol 2021, vol. 26, p. 4345:1-4345:13. https://futur.upc.edu/32049323

• Palma, K.; Moll, F. Current balancing random body bias in FDSOI cryptosystems as a countermeasure to leakage power analysis attacks. IEEE access, 2022, vol. 10, p. 13451-13459. https://futur.upc.edu/32563413

• Palma, K.; Moll, F. Analysis of Random Body Bias Application in FDSOI Cryptosystems as a Countermeasure to Leakage-Based Power Analysis Attacks, in IEEE Access, vol. 9, pp. 114977-114988, 2021, doi: 10.1109/ ACCESS.2021.3105635. https://futur.upc.edu/31982134

• Gonzalez, A.; Fons, F.; Moreno, J. The future roadmap of in-vehicle network processing: a HW-centric (R-)evoluon. IEEE access, 27 Juny 2022, vol. 10, p. 69223-69249. https://futur.upc.edu/34052928

• Calomarde, A; Manich, S; Rubio, A.; Gamiz, F. Influence of punch trough stop layer and well depths on the robustness of Bulk FinFETs to heavy Ions Impact. IEEE Access, 2 Maig 2022, vol. 10, p. 47169-47178. https://futur.upc.edu/33236122

• Rodriguez, E.; Otero, B.; Canal, R. A survey of machine and deep learning methods for privacy protection in the Internet of things. Sensors (Basel, Switzerland), 21 Gener 2023, vol. 23, núm. 3, article 1252, p. 1-24. https://futur.upc.edu/35235193

• Rallis, K; Dimitrakis, P; Karafyllidis, I. G.; Rubio, A; Sirakoulis, G. C. Electronic Properties of Graphene Nanoribbons With Defects. IEEE Transactions on Nanotechnology, 27 Gener 2021, vol. 20, p.151-160. https://futur.upc.edu/31270990

• Ros, E. [et al.]. Atomic layer deposition of vanadium oxide films for crystalline silicon solar cells. Materials advances, 2022, vol. 3, núm. 1, p. 337-345. https://futur.upc.edu/32524264

• Aghazadeh Dafsari, S. [et al.]. A 3–5-GHz, 385–540-ps CMOS true me delay element for ultra-wideband antenna arrays. AEÜ. International journal of electronics and communications, 1 Maig 2022, vol. 149, p. 154175:1-154175:6. https://futur.upc.edu/33052934

• Palà-Schönwälder, P. [et al.]. Superregeneration revisited: from principles to current applications. IEEE microwave magazine, 1 Febrer 2020, vol. 21, núm. 2, p. 35-47. https://futur.upc.edu/27083309

• Jullian, O. [et al.]. Deep-learning based detection for cyber-attacks in IoT networks: A distributed attack detection framework. Journal of network and systems management, 4 Febrer 2023, vol. 31, article 33, p. 1-24. https:// futur.upc.edu/35171545

• Sazeides, Y. [et al.]. A Real-Time Error Detection (RTD) architecture and its use for reliability and post-silicon validation for F/F based memory arrays. IEEE transactions on emerging topics in computing, 1 Abril 2022, vol. 10, núm. 2, p. 524-536. https://futur.upc.edu/34988309

• Rodrigo, S. [et al.]. On double full-stack communications-enabled architectures for multi-core quantum computers. IEEE micro, Setembre 2021, vol. 41, núm. 5, p. 48-56. https://futur.upc.edu/31866730

• Yang, B. [et al.]. Serial RRAM cell for secure bit concealing. Electronics, 31 Juliol 2021, vol. 10, núm. 15, p. 1-18. https://futur.upc.edu/31980118

• Yang, B. [et al.]. RRAM random number generator based on train of pulses. Electronics, 30 Juliol 2021, vol. 10, núm. 15, p. 1-9. https://futur.upc.edu/ 31980133

• Rodriguez-Montanes, R. [et al.]. Enhanced serial RRAM cell for unpredictable bit generation. Solid-state electronics, Maig 2021, vol. 183, p. 108059:1-108059:6. https://futur.upc.edu/31760997

Consulteu tots els articles publicats en semiconductors a futur.upc.edu